In_<0.5>Ga_<0.5>As/InAlAs Modulation-doped Field Effect Transistors on GaAs Substrates Grown by Low-Temperature Molecular Beam Epitaxy
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概要
- 論文の詳細を見る
We report on the lattice-mismatched growth and electrical properties of In_<0.5>Ga_<0.5>As/InAlAs modulation-doped heterostructures on GaAs substrates by molecular beam epitaxy using a wide-gap InAlAs graded buffer layer and low-temperature Molecular Beam Epitaxial growth at about 350℃. A drastic reduction in residual carrier accumulation has been achieved, and a high electron mobility at room temperature of 11100 cm^2/V・s was obtained with an electron concentration of 3×10^<12>/cm^2. It was found that the cause of residual carrier accumulation is related to the growth interruption or temperature rise after the growth of the graded buffer layer. The fabricated Modulation-doped Field Effect Transistors showed low output conductance, good pinch-off characteristics and no kink effect. The higher transconductance of 270 mS/mm was also obtained.
- 社団法人応用物理学会の論文
- 1991-12-30
著者
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Inoue K
Matsushita Electric Ind. Co. Ltd. Osaka Jpn
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Matsuno Toshinobu
Semiconductor Research Center Matsushita Electric Industrial Co. Lid.
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Inoue Kaoru
Semiconductor Laboratory Matsushita Electric Industrial Co. Ltd.
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Masato Hiroyuki
Semiconductor Research Center Matsushita Electric Industrial Co. Lid.
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