Theoretical Study on Total-Reflection-Angle Effect of Fluorescent X-Rays Emitted from Atoms Deposited on Surfaces

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概要

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• Theoretical analysis is performed for the angular distribution of fluorescent X-rays in a total-reflection-angle Xray spectroscopy (TRAXS) experiment. The angular dependence of fluorescent X-ray intensity is caused by the interference effect between the direct beam and that reflected by the substrate surface. The calculation results agree with the experimental results reported by Hasegawa et al. [Jpn. J. Appl. Phys. 24 (1985) L387].

• 社団法人応用物理学会の論文
• 1993-07-15

著者

• SUZUKI Yoshio

  Advanced Research Laboratory, Hitachi Ltd.

• Hasegawa Shuji

  Advanced Research Laboratory Hitachi Ltd.:(present Address)department Of Physics Faculty Of Science

• Suzuki Yoshio

  Advanced Research Laboratory Hitachi Ltd.

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