Strain Profile of Plastic Zone in Dislocation-Free Niobium Single Crystal Determined by X-Ray Topography
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概要
- 論文の詳細を見る
X-ray diffraction topography was employed in order to observe the deformation process of a dislocation-free niobium crystal.The X-ray image due to the mechanically deformed part of the crystal deviates from the straight extension of the image due to the undeformed part.The boundary between the deviated and the undeviated images is almost perpendicular to the slip derection.The deviation is caused by the deffraction of the polychromatic component of incident X-rays due to the lattice rotation associated with the tensile deformation.The strain profile was obtained behind the front of a plastic zone and found to be very sharp compared with those determined for polycrystals.
- 社団法人応用物理学会の論文
- 1978-11-05
著者
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Kamada Koji
Japan Atomic Energy Research Institute
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Naramoto Hiroshi
Japan Atomic Energy Agency Takasaki Jpn
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NARAMOTO Hiroshi
Japan Atomic Energy Research Institute,
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