Electrical Conduction of ZnO Varistors under Continuous DC Stress

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概要

• 論文の詳細を見る

• The degradation mechanism of I-V curves of ZnO varistors is investigated by means of thermally-stimulated currents and photoconductivity measurements. We postulate that the degradation is due to electrons and holes accumulated across the grain boundary face to face with each other such as polarized charges in a condenser. According to the photoconductivity measurements, the degradation of I-V characteristics is found to be due to the increase in carrier density and field-dependent drift mobility. In addition, the varistor after dc stressing shows n-type conduction. The conduction mechanism for the initial I-V characteristics is also discussed. A model similar to the mobility-gap model is proposed, and it is suggested that the intrinsic conduction should be taken into account for the Schottky-type conduction mechanism.

• 社団法人応用物理学会の論文
• 1980-05-05

著者

• Takada Yoshio

  Central Research Laboratory Mitsubishi Electric Corporation

• SATO Ken

  Central Research Laboratory, Mitsubishi Electric Corporation

• MAEKAWA Hiroshi

  Itami Works, Mitsubishi Electric Corporation

• OTOTAKE Masafumi

  Itami Works, Mitsubishi Electric Corporation

• TOMINAGA Shotaro

  Itami Works, Mitsubishi Electric Corporation

• Tominaga Shotaro

  Itami Works Mitsubishi Electric Corporation

• Ototake Masafumi

  Itami Works Mitsubishi Electric Corporation

• Maekawa Hiroshi

  Itami Works Mitsubishi Electric Corporation

• Sato Ken

  Central Research Laboratory Mitsubishi Electric Co. Ltd.

関連論文

• Non-Ohmic Current-Voltage Characteristics of the Compressed CdSe Powder
• Voltage-Current Characterisitcs of Compressed CdSe Powders
• D.C. Conductivity of Compressed CdSe Powders
• Electrical Conduction of ZnO Varistors under Continuous DC Stress
• Electrophotographic Properties of the Plate with a Polyvinylcarbazole Overlayer and a CdS-Resin Layer
• Electrical Charging of Photoconductive CdS Powders

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