A Constant-Load Tensile Device for an Ultra-High Voltage Electron Microscope and Its Applications to Materials Science

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概要

• 論文の詳細を見る

• A constant-load tensile device has been developed for in-situ deformation in an ultra-high voltage electron microscope. The device has two electrostrictive elements which are set face to face with each other. The specimen mounted on two movable jaws is stretched by applying voltage to the elements. The applied load is set by controlling a Wheatstone bridge composed of two strain gauges and resistors, and a minute change in the load is automatically corrected with a feedback circuit which controls the voltage to the electrostrictive elements. The device is placed on a universal goniometer stage. A heater located on the bottom of the universal goniometer stage heats the specimen up to about 200℃ by radiant heat. Experiments have been carried out to investigate the activation of dislocations under various conditions in aluminum single crystals.

• 社団法人応用物理学会の論文
• 1977-11-05

著者

• Tabata Teizo

  Research Center For Uhvem Osaka University

• Nakajima Yasuhiro

  Graduate School Osaka University

• Fujita Hiroshi

  Research Center For Uhvem Osaka University:(present Address)kinki University

• TABATA Teizo

  Research Center for Ultra-High Voltage Electron Microscopy, Osaka University

関連論文

• Characterization of Diamond Particles and Films Formed by Plasma-Assisted Chemical Vapour Deposition Using High-Voltage Electron Microscopy
• Position Control of Electron Energy Loss Spectrum in Case of Accelerating-Voltage Fluctuation
• Dynamic Study of Stacking Fault Tetrahedra Induced by Electron Irradiation in Copper Crystals
• Diffraction Contrast of Thickness Fringes in High Voltage Electron Microscope Images
• Electron Microscope Study of the Anomalous Transmission of Electrons in Aluminum up to 3 MV
• Some Applications of an Ultra-High Voltage Electron Microscope on Materials Science
• In-Situ Observation of Dislocation Behaviors in Melting Process of Aluminum by High Voltage Electron Microscopy
• A New Type of Very-High Temperature Heating Stage and In Situ Experiments on α-Al_2O_3 Crystals
• A Universal Environmental Cell for a 3MV-Class Electron Microscope and Its Applications to Metallurgical Subjects
• Nucleation of Crystals in Amorphous Materials
• Electron Irradiation Induced Amorphization at Dislocations in NiTi
• The Effect of Surface Layer on the Deformation Process of Copper Single Crystals
• Temperature Dependence of Electron-Irradiation Induced Amorphization of NiTi Alloys
• A Constant-Load Tensile Device for an Ultra-High Voltage Electron Microscope and Its Applications to Materials Science

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