Multi-Anvil Apparatus for High Pressure X-Ray Diffraction
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概要
- 論文の詳細を見る
An octahedral multi-anvil apparatus has been developed for the study of X-ray diffraction under high pressure. High pressures up to 150 kbar can be generated in the centre of split cones when they move together as external load is applied upon the outer surfaces. The X-ray beam is focused to the specimen through a horizontal plane between the two cones. Standard Debye-Scherrer camera method is utilized. The pressures required for the transitions of bismuth I-II, bismuth V-VI, tin I-II and lead I-II are determined from the lattice parameter of sodium chloride.
- 社団法人応用物理学会の論文
- 1977-10-05
著者
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Katayama Minoru
Department Of Material Physics Faculty Of Engineering Science Osaka University
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KAWAI Naoto
Department of Material Physics, Faculty of Engineering Science, Osaka University
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Onodera Akifumi
Department Of Material Physics Faculty Of Engineering Science Osaka University
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OHTANI Akihito
Department of Material Physics,Faculty of Engineering Science,Osaka University
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Kawai Naoto
Department Of Material Physics Faculty Of Engineering Science Osaka University
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MIZUKAMI Seishiro
Department of Material Physics, Faculty of Engineering Science, Osaka University
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Ohtani Akihito
Department Of Material Physics Faculty Of Engineering Science Osaka University
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Mizukami Seishiro
Department Of Material Physics Faculty Of Engineering Science Osaka University
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ONODERA Akifumi
Department of Material Physics, Faculty of Engineering Science, Osaka University
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