Size Effect Study on the Electrical Properties of Bismuth Films
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概要
- 論文の詳細を見る
Dependence of resistivity of bismuth films deposited onto microscopic glass slides at room temperature was studied at temperatures between -60℃ to 110℃. The study revealed an interesting phenomenon that the negative TCR in the thinner films changes with thickness becoming positive at higher thickness. It was also observed that films deposited at a low rate onto a heated substrate at 160℃ produces reversible films. The values of the mean free path and the specular scattering parameter obtained were 10300 Å and 0.9 respectively.
- 社団法人応用物理学会の論文
- 1975-10-05
著者
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Pal Arun
Department Of General Physics And X-rays Indian Association For The Cultivation Of Science
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SEN Paramita
Department of General Physics and X-Rays, Indian Association for the Cultivation of Science
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Sen Paramita
Department Of General Physics And X-rays Indian Association For The Cultivation Of Science
関連論文
- Photoconductivity and Thermoelectric Power of Zn_xCd_Se Films
- Size Effect Study on the Electrical Properties of Bismuth Films