Surface Electronic States and Field-Ion Image Intensity of Metals
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概要
- 論文の詳細を見る
The variation of the regional image intensity with the applied voltage was measured for the (001), (011) and (111) planes of W and Mo tips in the field-ion microscope. As the result, it was found that the regional image intensity of (111) plane of W and that of (001) plane of Mo tips didn't increase monotonically with the applied electric field. Total image intensities for W, Mo, Ir and Re were also measured and it was found that they decrease in the order of Re, Ir, Mo and W.
- 社団法人応用物理学会の論文
- 1970-11-05
著者
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Tamaki Shozo
Department Of Electronics Faculty Of Engineering Osaka University
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SUGATA Eizi
Department of Electronics, Faculty of Engineering, Osaka University
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Sugata Eizi
Department Of Electronics Faculty Of Engineering Osaka University
関連論文
- Surface Electronic States and Field-Ion Image Intensity of Metals
- Study of Field Emission Cathode by Field Ion Microscopy