5. UHFプラズマ (<講座>プロセス用の新しい高密度プラズマの生成と診断V)
スポンサーリンク
概要
- 論文の詳細を見る
To solve the serious problems concerning the higher electron temperature in high-density plasma, we have recently proposed the use of UHF(Ultra-high frequency) for plasma production. It was demonstrated in this study that low-electron-temperature and high-density plasmas for large-scale and precise etching processes could easily be produced with excellent uniformity by appling UHF of 500 MHz power to the plasma through a spokewise antenna. Additionally, the UHF plasma was found to possess a wider process window for etching processes than an ICP(Inductively Coupled Plasma) excited at 13.56 MHz. In the UHF plasma, high ion density and a high energy tail in the electron energy distributions can be maintained in a wider pressure range from 3 mTorr to 20 mTorr, whereas in the ICP plasma these characteristics are drastically reduced by increasing the gas pressure.
- 社団法人プラズマ・核融合学会の論文
- 1998-04-25
著者
関連論文
- マルチウィンドウ型アンテナを用いた極超短波プラズマ源
- レーザ誘起蛍光法によるパルスN_2誘導結合プラズマの診断
- 5. UHFプラズマ (プロセス用の新しい高密度プラズマの生成と診断V)
- 3. タイムモジュレーションプラズマによる高精度エッチング (ドライエッチング用プラズマ)
- UHFプラズマ源の特性評価およびドライエッチングへの応用