実測X線スペクトルのアンフォールディング法による補正とその限界

概要

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An x-ray spectrum measured by a semiconductor detector is different from the incident x-ray spectrum to the detector, because of distortions caused by energy-dependent responses of the detector and statistical and electrical fluctuations in the signal amplifying process. In this paper, we discuss a method for correcting the statistical and electrical fluctuations of the x-ray spectrum, using the unfolding method with a function based on the Gaussian distribution. Unfolding the measured x-ray spectrum by this method, K-α and K-β characteristic x-rays were clearly separated into two line spectra, and energy resolution was improved. The unfolding method, when used to supplement the stripping method that is generally applied to x-ray spectra correction, will provide enhanced correction of x-ray spectra.
公益社団法人日本放射線技術学会の論文
1998-05-20