高純度ゲルマニウム半導体検出器を用いて測定したX線スペクトルの補正計算コードの開発

概要

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The X-ray spectrum, measured by a high-purity germanium (HP-Ge) semiconductor detector, is the spectrum of energy absorbed in the germanium crystal. Therefore, to obtain the incident X-ray spectrum to the detector, the output spectral data from the detector must be corrected considering the energy-dependent response of the detector. The response of a HP-Ge detector to incident photon beams depends on the shape and size of the crystal and the geometry of measurement such as the photon incident angle to the detector. Accordingly, if the response data, which were used for the correction of measured spectrum, dose not correspond to the factors of measurement, the incident spectrum can not be obtained correctly. We have developed a computer code, SPECX, for correction of output spectral data measured by a HP-Ge detector. Using this code, the incident X-ray spectrum to the detector can be obtained from the output spectral data measured by any shape and size of the HP-Ge crystal and any geometry of measurement.
公益社団法人日本放射線技術学会の論文
1995-04-01