A Time Domain Reflectometry Using Envelope Extraction and Its Application to Measurement of Stripline Resonator Characteristics (Special Issue on Measurement Techniques for Microwave/Millimeter Wave)
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概要
- 論文の詳細を見る
A kind of time domain reflectometry using deconvolution and envelope extraction process is presented for measuring microwave resonator characteristics, where data acquisition and data processing are performed entirely in the time domain. The proposed method may be used to characterize resonators which have Q values in the range between a few dozen and several hundred. The major drawback of the time domain measurement techniques is in general considered to be a low frequency resolution. In the proposed method, it is avoided skillfully.
- 社団法人電子情報通信学会の論文
- 1994-06-25
著者
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Omori Tatsuya
The Graduate School Of Science And Technology Chiba University
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Omori Tatsuya
Graduate School Of Engineering Chiba University
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Ohkawa Sumio
Faculty Of Engineering Chiba University
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Ohkawa Sumio
Graduate School of Science and Technology, Chiba University
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Yashiro Ken'ichiro
Department Of Electronics And Mechanical Engineering Chiba University
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