Improving Random Pattern Testability with Partial Circuit Duplication Approach(Special Issue on Test and Diagnosis of VLSI)

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概要

• 論文の詳細を見る

• The advantage of random testing is that test application can be performed at a low cost in the BIST scheme. However, not all circuits are random pattern testable due to the existence of random pattern resistant faults. In this paper, we present a method for improving the random pattern testability of logic circuits by partial circuit duplication approach. The basic idea is to detect random pattern resistant faults by using the difference between the duplicated part of a circuit and the original part. Experimental results on benchmark circuits show that high fault coverage can be achieved with a very small amount of hardware overhead.

• 社団法人電子情報通信学会の論文
• 1998-07-25

著者

• Tamamoto Hideo

  The Department Of Information Engineering Akita University

• Tamamoto Hideo

  The Dept.of Information Engineering Mining College Akita University

• Wen Xiaoqing

  The Syntest Technologies Inc.

• YOKOYAMA Hiroshi

  the Dept.of Information Engineering, Mining College, Akita University

• Yokoyama Hiroshi

  The Dept.of Information Engineering Mining College Akita University

関連論文

• Transistor Leakage Fault Diagnosis for CMOS Circuits(Special Issue on Test and Diagnosis of VLSI)
• Transistor Leakage Fault Diagnosis with I_DDQ and Logic Information
• Improving Random Pattern Testability with Partial Circuit Duplication Approach(Special Issue on Test and Diagnosis of VLSI)

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