An Efficient Fault Simulation Method for Reconvergent Fan-Out Stem (Special Issue on VLSI Testing and Testable Design)

スポンサーリンク

概要

• 論文の詳細を見る

• In this paper, we present an efficient method for the fault simulation of the reconvergent fan-out stem. Our method minimizes the fault propagating region by analyzing the topology of the circuit, whose region is smaller than that of Tulip's. The efficiency of our method is illustrated by experimental results for a set of benchmark circuits.

• 社団法人電子情報通信学会の論文
• 1993-07-25

著者

• Park Kyuho

  Department Of Electrical Engineering Korea Advanced Institute Of Science And Technology

• Park Kyuho

  Department Of Electrical Engineering And Computer Science Korea Advanced Institute Of Science And Te

• Lee S

  Postech Pohang Kor

• Lee SangSeol

  Department of Electrical Engineering, Korea Advanced Institute of Science and Technology

関連論文

• Definition of Attributed Random Graph and Proposal of Its Applications
• An Efficient Fault Simulation Method for Reconvergent Fan-Out Stem (Special Issue on VLSI Testing and Testable Design)
• TLB Update-Hint : A Scalable TLB Consistency Algorithm for Cache-Coherent Non-uniform Memory Access Multiprocessors(Networking and System Architectures)(Hardware/Software Support for High Performance Scientific and Engineering Computing)

スポンサーリンク