Measurements on Low Frequency Phase and Amplitude Fluctuations and Its Application to Reduce the Noise in Bipolar Transistor Circuits

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概要

• 論文の詳細を見る

• A system for measuring the low frequency amplitude and phase noises was set-up, with employing a phase sensitive detector and phase-shifter. It is noted that both noises were partly correlated. The phase noise was explained by the transit time fluctuation due to the fluctuating diffusion coefficient. The amplitude noise reduction was demonstrated by applying the inverted output of the phase noise to the amplitude noise.

• 一般社団法人電子情報通信学会の論文
• 1995-02-25

著者

• Takagi Keiji

  The Faculty Of Engineering Kyushu Institute Of Technology

関連論文

• Measurements on Low Frequency Phase and Amplitude Fluctuations and Its Application to Reduce the Noise in Bipolar Transistor Circuits

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