High Reliability Design Method of LC Tuning Circuit and Substantiation of Aging Characteristics for 20 Years (Special Section on Reliability)

概要

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In 1963, the authors began to develop a tuning circuit (hereafter referred to as the 'circuit') consisting of an inductor, fixed capacitors and a variable capacitor. The circuit required very high accuracy and stability, and the aging influence on resonant frequency needed to be Δf/f_0≦±0.12% for 20 years. When we started, there was no methodology available for designing such a long-term stable circuit, so we reinvestigated our previous studies concerning aging characteristics and formed a design concept. We designed the circuit by bearing in mind that an inductor was subject to natural and stress demagnetization (as indicated by disaccommodation), and assumed that a capacitor changed its characteristics linearly over a logarithmic scale of time. (This assumption was based on short-term test results derived from previous studies.) We measured the aging characteristics of the circuits at room temperature for 20 years, from . The measurement results from the 20-year study revealed that the aging characteristics predicted by the design concept were reasonably accurate.
社団法人電子情報通信学会の論文
1994-01-25