Fault Diagnosis for RAMs Using Walsh Spectrum(Memory Testing)(<Special Section>Test and Verification of VLSI)

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概要

• 論文の詳細を見る

• In this paper, we show a method to locate a single stuckat fault of a random access memory (RAM). From the fail-bitmaps of the RAM, we obtain their Walsh spectrum. For a single stuck-at fault, we show that the fault can be identified and located by using only the 0-th and 1-st coefficients of the spectrum. We also show a circuit to compute these coefficients. The computation time is O(2^n), where n is the number of bits in the address of the RAM. The computation time is much shorter than one that uses a logic minimization method.

• 社団法人電子情報通信学会の論文
• 2004-03-01

著者

• Sasao Tsutomu

  Center For Microelectronic Systems Kyushu Institute Of Technology

• Iguchi Yukihiro

  Department Of Computer Science And Electronics Kyushu Institute Of Technology

• ISENO Atsumu

  Department of Computer Science, Meiji University

• Iseno Atsumu

  Department Of Computer Science Meiji University

関連論文

• Bi-Partition of Shared Binary Decision Diagrams(Special Section on VLSI Design and CAD Algorithms)
• A Realization of Multiple-Output Functions by a Look-Up Table Ring(Logic Synthesis)(VLSI Design and CAD Algorithms)
• Design Methods of Radix Converters Using Arithmetic Decompositions(Computer Components)
• Area-Time Complexities of Multi-Valued Decision Diagrams(Discrete Mathematics and Its Applications)
• Fault Diagnosis for RAMs Using Walsh Spectrum(Memory Testing)(Test and Verification of VLSI)

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