High Power In_0.49Ga_0.51P/In_0.15Ga_0.85As Heterostructure Doped-Channel FETs (Joint Special Issue on Heterostructure Microelectronics with TWHM 2000)
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概要
- 論文の詳細を見る
A high barrier Schottky gate on InGaP/InGaAs doped-channel FETs(DCFETs) provides a high current density, high gate-to-drain breakdown voltage and a better linear operation over a wide gate bias range. However, these doped-channel devices are limited by a large parasitic resistance associated with a 20 nm thick undoped InGaP layer benbeath the gate metal. In this study, we inserted a Si δ-doped layer inside this high bandgap undoped InGaP layer to reduce parasitic resistances and to enhance device DC and RF power performance. These modified DCFETs (M-DCFETs) demonstrated an output power density of 204 mW/mm, a power-added efficiency of 45%, and a linear power gain of 18.3dB for an 1 mm gate-width device under a 2.4 GHz operation. These characteristics suggest that doped-channel FETs with a Si δ-doped layer provide a good potential for high power microwave device applications.
- 社団法人電子情報通信学会の論文
- 2001-10-01
著者
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CHAN Yi-Jen
Dept. of Electrical Engineering, National Central University
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Chiu H‐c
National Central Univ. Jungli Twn
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CHIU Hsien-Chin
the Department of Electrical Engineering, National Central University
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CHAN Yi-Jen
the Department of Electrical Engineering, National Central University
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Yang Shih-cheng
Department Of Electrical Engineering National Central University Jungli
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Chan Y‐j
Dept. Of Electrical Engineering National Central University
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Yang S‐c
Department Of Electrical Engineering National Central University Jungli
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Lin Hao-hsiung
The Department Of Electrical Engineering National Taiwan University
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Yang Shih-Cheng
the Department of Electrical Engineering, National Central University
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Chiu Hsien-chin
The Department Of Electrical Engineering National Central University
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Chan Yi-jen
The Department Of Electrical Engineering National Central University
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