Electrical Properties of YBa_2Cu_3O_x Films Grown by Liquid Phase Epitaxy(Special Issue on Superconductive Electron Devices and Their Applications)

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YBa_2Cu_3O_x films were grown on MgO(100) substrates by liquid phase epitaxy. Their structural and electrical properties were examined. From TEM plan-view images, it is found that the film consists of large grains whose misorientation angles are less than 1^o. Although the DC critical current density values decrease with increasing the film thickness, the critical current density value of 9.3×10^5 A/cm^2 at 77K is obtained for a 7 μm-thick film. A microstrip resonator at 10.8GHz with a YBCO ground plane shows Q_0 values of 14200 at 77K and 23300 at 40K, which correspond to surface resistance values of 650 and 400μΩ, respectively. By using a microstrip line resonator with a Ti/Au ground plane, the critical field of the film at 77K and 10.8GHz is estimated to 30 Oe. The third-order intercept of the resonator with the Ti/Au ground plane is the input power of +43 dbm and the output power of +30dBm at 77K.
社団法人電子情報通信学会の論文
1998-10-25