Complex Permittivity Measurement at Pseudo Micro-wave Frequency Using a Dielectric-Plate-Loaded Cavity Resonator
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概要
- 論文の詳細を見る
This paper describes a nondestructive measurement method for complex permittivity of dielectric plates at 2GHz, using a cylindrical cavity resonator. The resonator is divided into two parts at the center. Two dielectric plates are symmetrically loaded around the center of the cavity. These plates have high permittivity of 45. A dielectric plate specimen is clamped with these halves. The values of relative permittivity ε' and loss tangent tanδ of the specimen are obtained from the resonant frequency and unloaded Q-value of TE_lt011gt mode. Measured results of various materials are compared with those values obtained at 3 and 10GHz by other cavity resonator method. An edge effect is taken into account by a reference method, using measurement data of a sapphire plate. The errors of the present method are smaller than 1% and 2-3×10^lt-5gt for ε' and tanδ, respectively.
- 社団法人電子情報通信学会の論文
- 1997-08-25
著者
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Nakayama A
Rampd Center Kagoshima Kyocera Corporation
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NAKAYAMA Akira
RampD Center Kagoshima, Kyocera Corporation
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FUKUURA Atsuomi
RampD Center Kagoshima, Kyocera Corporation
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NISHIMURA Michiaki
RampD Center Kagoshima, Kyocera Corporation
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Nishimura M
Ikegami Tsushinki Co. Tokyo Jpn
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Fukuura Atsuomi
Rampd Center Kagoshima Kyocera Corporation
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Nakayama Akira
Rampd Center Kagoshima Kyocera Corporation
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- Complex Permittivity Measurement at Pseudo Micro-wave Frequency Using a Dielectric-Plate-Loaded Cavity Resonator
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