Characterization of Single and Coupled Microstrip Lines Covered with Protective Dielectric Film

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概要

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• In this paper, we presented an analysis of single and coupled microstrip lines covered with protective dielectric film which is usually used in the microwave integrated circuits. The method employed in the characterization is called partial-boundary element method (p-BEM). The p-BEM provides an efficient means to the analysis of the structures with multilayered media or covered with protective dielectric film. The numerical results show that by changing the thickness of the protective dielectric films such as SiO_2, Si and Polyimide covered on these lines on a GaAs substrate, the coupled microstrip lines vary within 10% on the characteristic impedance and within 25% on the effective dielectric constant for the odd mode of coupled microstrip line, respectively, in comparison with the structures without the protective dielectric film. In contrast, the single microstrip lines vary within 4% on the characteristic impedance and within 8% on the effective dielectric constant, respectively. The protective dielectric film affects the odd mode of the coupled lines more strongly than the even mode and the characteristics of the single microstrip lines.

• 社団法人電子情報通信学会の論文
• 1995-08-25

著者

• Li Keren

  Department of Electronic Engineering, The University of Electro-communications

• Atsuki Kazuhiko

  Department of Electronic Engineering, The University of Electro-communications

• Li Keren

  Department Of Electronic Engineering The University Of Electro-communications

• Li Keren

  Department Of Electronics The University Of Electro-communications

• Yamaguchi Shoichiro

  Department of Electronics, the University of Electro-Communications

• Atsuki Kazuhiko

  Department Of Electronics The University Of Electro-communications

• Atsuki Kazuhiko

  Department Of Electronic Engineering The University Of Electro-communications

• Yamaguchi Shoichiro

  Department Of Electrical Engineering Faculty Of Engineering Tokyo Institute Of Technology

• Yamaguchi Shoichiro

  Department Of Electronics The University Of Electro-communications

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• ANALYTICAL GREEN'S FUNCTION FOR MULTILAYERED MEDIUM STRUCTURE AND ITS APPLICATION TO ANALYSIS OF PLANAR TRANSMISSION LINES
• Characterization of Single and Coupled Microstrip Lines Covered with Protective Dielectric Film
• Dispersion Controlled and Polarization Maintaining Photonic Crystal Fibers for High Performance Network Systems(Photonic Crystals and Their Device Applications)
• Highly Nonlinear Dispersion-Flattened Polarization-Maintaining Photonic Crystal Fiber in 1.55μm Region(Optoelectronics)
• Three-Dimensional Analytical Electrostatic Green's Functions for Shielded and Open Arbitrarily Multilayered Medium Structures and Their Application to Analysis of Microstrip Discontinuities
• Generalized Fresnel Transformations and Their Properties
• Functional Analysis of Diffraction Integral Transform. I.
• Kernel Expansions of Generalized Fresnel Transform
• Functional Analysis of Diffraction Integral Transform II.

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