Characterization of Planar Transmission Line Structures on Multilayered Dielectric Substrates

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概要

• 論文の詳細を見る

• Characterization of discontinuities in conductor backed coplanar waveguides (CBCPWs)on multilayered dielectric substrates are implemented by using the FDTD method. Frequency dependence of the scattering parameters and losses associated with a variety of discontinuities are in vestigated, with emphasis on the comparison between the loss characteristics of the studied structures. The presented results indicate clearly that losses associated with discontinuities in non-leaky coplanar (NLC) waveguides [7] are significantly smaller than those in conventional CBCPWs over a certain frequency range.

• 社団法人電子情報通信学会の論文
• 1996-04-25

著者

• Ma Zhewang

  The University Of Electro-communications

• Yamashita Eikichi

  The University of Electro-communications

関連論文

• Characterization of Planar Transmission Line Structures on Multilayered Dielectric Substrates
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