A New Ellipsoidal Mirror-Type Reflectometer for Measuring Normal-Incident Hemispherical Reflectance Spectrum
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概要
- 論文の詳細を見る
A new reflectometer system is developed to measure the radiation characteristics of solid materials from a heat transfer science point of view. This system employs an ellipsoidal mirror in a simple optical alignment, and measures the spectrum of the normal-incident hemispherical reflectance in the wavelength region of 0. 35 to 1. 10μm. A single spectral scanning gives a hemispherical reflectance spectrum which completely covers both the specular and diffuse components of reflection. The reflectance is directly interpreted in terms of the absorptance for the normal incidence. The system also readily measures the angular characteristics of reflection. The system is applied to a systematic study of the reflection characteristics of rough metal surfaces. The predominant contribution of the specular component to the angular characteristics is demonstrated.
- 一般社団法人日本機械学会の論文
- 1993-02-15
著者
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YOSHIDA Toshimi
Department of Surgery, Nippon Steel Hirohata Hospital
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Makino Toshiro
Department Of Engineering Science Kyoto University
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Makino Toshiro
Department Of Engineering Physics And Mechanics Kyoto University
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Yoshida T
Teikyo Univ. Tochigi Prefecture Jpn
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Yoshida Toshimi
Department Of Fermentation Technology Faculty Of Engineering Osaka University
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Tanaka Sadayuki
Department of Mechanical Engineering, Fukui National College of Technology
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Tanaka Sadayuki
Department Of Mechanical Engineering Fukui National College Of Technology
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MAKINO Toshiro
Department of Engineering Science, Kyoto University
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