微量成分分析のための減圧ヘリウム誘導結合プラズマ質量分析法の研究

概要

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Inductively coupled plasma mass spectrometry (ICP-MS) offers a powerful analytical method. The mass spectral interferences, however, often become a serious problem. To overcome this problem, a low-pressure helium-ICP was studied for the ionization source. This helium plasma was generated in a water-cooled plasma torch. In order to minimize the background spectra, a sampling orifice was fabricated from aluminum metal. An aqueous sample-introduction technique was developed. The sample solution was converted into tiny droplets with an ultrasonic nebulizer, and then dried in a heater. The resulting dried aerosol was successfully introduced into the plasma through a PTFE capillary tube. Other sample-introducing techniques were examined, including electrothermal vaporization and laser ablation. The detection limits were measured based on 3σ for a wide range of elements in the periodic table. Improved lower detection limits were obtained for halogens, C, Cr, Fe, Se, and so on. The diagnosis of helium plasma with a Langmuir probe indicated that the plasma temperature was higher than that of the conventional argon plasma, which may contribute to an enhancement of the detectability. The analytical capability of the proposed ICP-MS was demonstrated by analyzing various types of certified reference materials.
社団法人日本分析化学会の論文
2005-02-05