Distributed Garbage Collection for the Parallel Inference Machine : PIE64

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概要

• 論文の詳細を見る

• In this paper, we will present an elegant algorithm for garbage collection of distributed heap memories. Our method mainly combines reference counting on memory page with a global Mark-Scan scheme. This algorithm is very time-efficient, partly real-time and can be implemented with very little space overhead. The sources of its efficiency are discrimination of single reference objects, memory allocation and management according to object lifetime, and special hardware support for global Mark-Scan GC.

• 一般社団法人情報処理学会の論文
• 1989-03-15

著者

• Xu L

  東大 工

• Koike H

  Tanaka Lab. Dept. Of Electrical Engineering Univ. Of Tokyo

• Tanaka H

  Graduate School Of Electrical Engineering The University Of Tokyo

• Xu Lu

  Tanaka Lab., Dept. of Electrical Engineering, Univ. of Tokyo

• Shimada Kentaro

  Tanaka Lab., Dept. of Electrical Engineering, Univ. of Tokyo

• Shimizu Takeshi

  Tanaka Lab., Dept. of Electrical Engineering, Univ. of Tokyo

• Koike Hanpei

  Tanaka Lab., Dept. of Electrical Engineering, Univ. of Tokyo

• Tanaka Hidehiko

  Tanaka Lab., Dept. of Electrical Engineering, Univ. of Tokyo

• Shimada Kentaro

  Tanaka Lab. Dept. Of Electrical Engineering Univ. Of Tokyo

• Shimizu Takeshi

  Tanaka Lab. Dept. Of Electrical Engineering Univ. Of Tokyo

関連論文

• A Procedure for K-Local Testability
• Distributed Garbage Collection for the Parallel Inference Machine : PIE64
• A Study of Garbage Collection for PIE64

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