CMOS水晶発振器の回路側に基づく周波数経時変化

概要

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The frequency aging of a CMOS crystal oscillator may be affected by the oscillator circuit as well as the crystal resonator included. This paper deals with the experimental study of the aging caused by the circuit itself measured With an unique System. The system has a wel1- designed oven in which a crystal oscillator is driven stably at a constant temperature. The two frequencies, i. e., the frequency of the ocillator and the non-reactive frequency of the crystal resonator, can be taken out of the oven selectively through a relay, and measured accurately by referring to the LF standard wave. Using a simple equation including the two measured frequencies, the aging of an equivalent load capacitance on the crystal resonator may be estimated, which seems to be the principal cause of the frequency aging. As the result of these experiments continued for more than one hundred days, the aging of the equivalent load capacitance has been found to be unexpectedly large. It should be reduced further in order to improve the frequency stability of the CMOS crystal oscillator. The details of the method and the results of the experiments are shown in the present paper.
社団法人日本時計学会の論文
1983-09-25