Locally Exhaustive Testing of Combinational Circuits Using Linear Logic Circuits

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概要

• 論文の詳細を見る

• Locally exhaustive testing of multiple output combinational circuits is the test which provides exhaustive pat-terns for each set of inputs on which each output is truly dependent. In this paper, a method for locally exhaustive testing of combinational circuits using linear logic circuits is proposed. The testing scheme consists of a linear combinational circuit and a linear feedback shift register. This scheme can be implemented with smaller amounts of hardware than other existing methods, and can be applied to built-in self testing. The correspondence problem between the outputs of the linear combinational circuit and the inputs of the circuit under test is formalized as a vector assignment problem of hypergraphs. It resembles the coloring problem of graphs and is also proved to be NP-complete. The vector assignment of perfect hypergrahs is shown to be equivalent to the construction of linear codes. Several graph-theoretical properties which can be utilized to reduce the size of hypergraphs are shown. Finally, the length of test sequences is discussed.

• 一般社団法人情報処理学会の論文
• 1988-11-25

著者

• Yajima S

  Kyoto Univ.

• Yajima Shuzo

  Department Of Information Science Kyoto University

• Kawahara Kenji

  Computer Systems Laboratories Sharp Corporation

• Hiraishi H

  Kyoto Sangyo Univ. Kyoto‐shi Jpn

• Hiraishi Hiromi

  Department Of Information And Communication Sciences Faculty Of Engineering Kyoto Sangyo University

• Yajima Shuzo

  Department Of Information Science Facu1ty Of Engineering Kyoto University

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• Regular Temporal Logic Expressively Equivalent to Finite Automata and Its Application to Logic Design Verification
• Locally Exhaustive Testing of Combinational Circuits Using Linear Logic Circuits
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• The Complexity of the Optimal Variable Ordering Problems of a Shared Binary Decision Diagram
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• Combinatorial Algorithms Using Boolean Processing
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