A Novel Approach to Fault-Tolerant Logic

概要

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This paper presents a design scheme that supplies logic circuits with very high reliability by providing redundancy to gate function logic using conventional gates. The basic redundant logic circuits are called Fault-Tolerant Gates (FTGs). The construction and design of FTGs, such as AND, OR, NOT, NAND, NOR and Exclusive OR gates, are described. The improved reliability of these FTGs is evaluated in comparison with conventional gates. An FTG is shown to have a stronger restoring function than any voting circuit. The reliability improvements for the proposed FTGs are discussed for Full Adder and Arithmetic Logic Unit (ALU)applications. The reliability of VLSIs employing FTGs is discussed in terms of the development of ultra reliable computers. The new design scheme not only greatly increases the reliability of logic circuits, but also may improve the yield of VLSIs.
一般社団法人情報処理学会の論文
1980-09-30