On Interferometry for Measurement of Shear Strain and Rotation by Using Diffraction Beams

概要

論文の詳細を見る
A new interferometry for measurement of shear strain and rotation in an in-plane deformation is proposed. In this method the grating printed on an object is photographed on film or plate and four copies (say, specimen gratings) are prepared at first. Then two pairs of these specimen gratings are placed in both of optical paths in Mach-Zender Interferometer, respectively, and diffraction beams of diffraction beams at pairs of the gratings are used for producing an interference pattern. This is corresponds to a contour of shear strain γ_<xy> or rotation ω. Here, orders of diffraction beams to be used and directions toward which gratings are shifted are chosen according to γ_<xy> or ω. This method can also be applied to measurement of higher order differences of displacement. Some other modifications of the method are given and their properties are discussed.
一般社団法人日本機械学会の論文