電気抵抗法による2成分粒子系ランダムネス推定 : サンプリング法(<小特集>粉体小特集)

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Previous studies for estimating randomness of a binary solid particle system have shown that the total electric resistance, R_S calculated by an approximation method is closely related to the degree of mixing. In this report, in order to estimate the randomness of the system, a parameter of short range disorder, σ_S was introduced as a criterion of the degree of mixing of the system. The short range disorder was defined as a ratio T_C/ T_S, where T_C represents the number of contact points between particles with different resistance (A particles and B particles) and T_S represents the total number of contact points of all particles. The values of degree of mixing obtained from two different methods (one is the spot sampling and the other is the total inspection) were compared with the values of the parameter of short range disorder. Furthermore, in order to assess these methods, the correlation functions between σ_S vs. σ_<TL>, σ_S vs. σ_<SL>, vs. R_S,σ_<TL> vs. R_S and σ_<SL> vs. R_S were calculated, where σ_S is the parameter of short-range disorder, σ_<TL> is the standard deviation of the total inspection, and σ_<SL> is the standard deviation of the spot sampling. The computer simulated results showed that each correlation function described above is valid. Consequently, the total electric resistance calculated by an approximation (series and parallel) method can be used for the purpose of estimating randomness during the mixing process. However, in the spot sampling, the calculated values of degree of mixing was found to be affected by the number of samples and the sample size.
社団法人日本材料学会の論文
1988-11-15

電気抵抗法による2成分粒子系ランダムネス推定 : サンプリング法(<小特集>粉体小特集)

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