Direct Observation of Antiparallel 180° Domains in BaTi0_3 by X-Ray Anomalous Dispersion Metthod

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概要

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• Antiparallel domain configurations in c-plate crystal are observed in {O03} x-ray reflection micrographs by the intensity contrast caused by nomalous scattering of the incident CrKα radiation by Ba and Ti atoms. The micrographs are taken with the scanning method of Lang applied to the reflection case. Measured ratio between |F(003^^-)|^2 and |F(O03)|^2 by a single-crystal-diffractometer amounts to 1.16. It is shown that with this reflection the antiparallel domains can be clearly discriminated in the x-ray reflection images with strong intensity contrast, and that the domain reversal process can be followed non-destructively.

• 社団法人日本物理学会の論文
• 1964-04-05

著者

• Niizeki Nobukazu

  Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation

• Hasegawa Masahiko

  Electrical Communication Laboratory Nippon Telegraph And Telephone Public Corporation

• HASEGAWA Masahiko

  Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation

• Niizeki N.

  Electrical Communication Laboratory, Nippon Telegraph and Telephone Public Corporation

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• Direct Observation of Antiparallel 180° Domains in BaTi0_3 by X-Ray Anomalous Dispersion Metthod

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