Structure of Thin Layers of Some F. C. C. Metals Deposited on Oriented Ag, Pd and Ni Films

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概要

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• Some f. c. c. meas-Ni, Cu, Pd, Al, Au, Ag and Pb-were evaporated in vacuo on to oriented Ag, Pd and Ni films and the structure of the films was studied the transmission method of electron diffraction. Some films were composed of intermetallic compounds of deposit and substrate metals. But some films were composed of two layers of deposit and substrate metals. In the latter case, the deposit metals grew in the (001) or (111) oriented over growth on a substrate metal at a temperature higher than an epitaxial temperature. The occurrence of these two kinds of oriented overgrowth depended mainly on the percentage misfits.

• 社団法人日本物理学会の論文
• 1961-10-05

著者

• Nomura Masayoshi

  College Of Arts And Sciences Tohoku University

• Fukuda Yoshiichi

  College Of Arts And Sciences Tohoku University

• SHIRAI Shunji

  College of Arts and Sciences, Tohoku University

• Shirai Shunji

  College Of Arts And Sciences Tohoku University

• Shirai S.

  College of Arts and Sciences, Tohoku University

関連論文

• Structure of Thin Layers of Some F. C. C. Metals Deposited on Oriented Ag, Pd and Ni Films
• Moment Method (Part I. Time Independent Problem)
• Electronic States in Perturbed Two-Dimensional Graphite Lattice
• An Interpretation of the Oriented Overgrowth of Metal
• Vibration of Linear Lattice Containing Impurities
• Frequency Spectrum of Lattice with Short Range Order

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