The X-Ray Topography with a Background of a Low Level in Bragg Case

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概要

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• The intensity distribution of X-ray wave field in Bragg case in a deformedcrystal is calculated by solving Takagi's equatiorts for an incidence of a verynarrow wave. The intensity flow which will contribute to a formation of theimage for a deformation in a crystal can be seen separate from the intensitydistribution due to the direct reflection of incident wave on the entrance surface.A method for the topographic observation of a deformation almost without theintensity to give rise to a background is suggested. This method would be usedfor the traverse topography as well as the section one in Bragg case. It is alsodiscussed that the suggested topographic method may be arranged to select anarea to observe.

• 社団法人日本物理学会の論文
• 1985-07-15

著者

• Uragami T

  Faculty Of Science Okayama University Of Science

• URAGAMI Takuyuki

  Faculty of Science,Okayama University of Science

• Uragami Takuyuki

  Faculty Of Science Okayama University Of Science

関連論文

• The X-Ray Topography with a Background of a Low Level in Bragg Case
• The Intensity Enhancement of Diffracted Wave of X-Rays at the Rear Surface
• The Intensity Distribution of X-Rays in a Thin Crystal in Bragg Case

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