Upward Curvature of the Temperature Dependence of Upper Critical Magnetic Field Perpendicular to Superconducting Aluminum Films

概要

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The temperature dependence of the electrical resistance of thin granularaluminum films shows the maximum far above the superconducting transitiontemperature due to both effects of thermodynamic fluctuations and electronlocalization, for the film with large normal-state sheet resistance R'. The tem-rerature aerenaence or the ur>rer critical field or the film with m':to' (!Q/El)shows the upward curvature. The results on the upper critical field are explainedby a current theory of dirty superconductors including electron localization andelectron-electron interactions.
1983-07-15