Quantized Hall Resistivity in Si-MOSFETs Measured at Liq.^3He Temperatures
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概要
- 論文の詳細を見る
The transverse and Hall resistivities of electrons in Si-MOS inversion layerhave been measured at ]:0.5 K in the magnetic fields f=9.0 T and 10.5 T, at thegate voltages around the transverse resistivity minima. The Hall resistivity isfound to be integral fractions of hoe" in precision better than 2 parts in 10' overthe concentration of electrons ieH/hc ranging from ] x 10" cm ' (7=4) to 3 x 10"cm=' (Z=I2).
- 社団法人日本物理学会の論文
- 1982-01-15
著者
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KAWAJI Shinji
Department of Physics,Gakushuin University
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Inagaki Katsuya
Device Fundamentals Section Electrotechnical Laboratory
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Inagaki Katsuya
Electrotechnical Laboratory
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Kawaji Shinji
Department Of Physics And Chemistry Gakushuin University
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KINOSHITA Joji
Electrotechnical Laboratory, National Institute of Advanced Industrial Science and Technology
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Kinoshita J
Tokyo Inst. Of Technol. Yokohama Jpn
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Kinoshita Joji
Device Fundamentals Section Electrotechnical Laboratory
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Kinoshita Joji
Electrotechnical Laboratory
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YOSHIHIRO Kazuo
Device Fundamentals Section, Electrotechnical Laboratory
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YAMANOUCHI Chikako
Device Fundamentals Section, Electrotechnical Laboratory
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YOSHIHIRO Kazuo
Electrotechnical Laboratory
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YAMANOUCHI Chikako
Electrotechnical Laboratory
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MORIYAMA Jiro
Department of Physics,Gakushuin University
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Moriyama Jiro
Department Of Physics Gakushuin University
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Yamanouchi C
Device Fundamentals Section Electrotechnical Laboratory
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Yoshihiro K
Device Fundamentals Section Electrotechnical Laboratory
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INAGAKI Katsuya
Device Fundamentals Section, Electrotechnical Laboratory
関連論文
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- Localization and Quantum Hall Effect in Two-Dimensional Systems Under Strong Magnetic Fields(Transport and Fermiology)
- Phase Boundaries between Quantum Hall Metal and Hall Insulator in Si-MOSFET's and Many-Body Enhancement of Valley- and Zeeman-Splitting
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- Breakdown of the Quantum Hall Effect in GaAs/AlGaAs Heterostructures Due to Current
- Improved Quantum Hall Standard of Resistance at Electrotechnical Laboratory(General Physics)
- Resistance Ratio Bridge Using Cryogenic Current Comparator with DC-Superconducting Quantum Interference Device Magnetometer
- Collapse of Quantized Hall Resistance and Breakdown of IQHE in GaAs/AlGaAs Heterostructures
- Temperature Dependence of Collapse of Quantized Hall Resistance(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)
- Effects of Light and Temperature on the Growth of Silicon Stain Films
- Deep Trap Levels in Silicon P-N Junctions
- Activation Energies of the Fractional Quantum Hall Effect in GaAs/AlGaAs Heterostructures
- Anomalous Magnetoresistance in Perpendicular Magnetic Fields Observed in High Mobility GaAs/Al_xGa_As Interfaces
- Activation Energies of the 1/3 and 2/3 Fractional Quantum Hall Effect in GaAs/Al_xGa_As Heterostructures
- Negative Magnetoresistance and Inelastic Scattering Time in Two-Dimensional Electron Systems in GaAs/Al_xGa_As Heterojunction Interfaces
- Electron Concentration and Mobility Dependence of Breakdown of the Quantum Hall Effect
- Determination of the Fine Structure Constant Based on the Quantum Hall Effect
- Quantized Hall Resistivity in Si-MOSFETs Measured at Liq.^3He Temperatures
- Superconductivity in InAs Surfaces
- Effect of Residual Stress on Hole Mobility of SOS MOS Devices
- Piezoresistance and Piezo-Hall Effect in Heavily Doped n-Type Silicon
- Magnetic Anomaly in the Metallic Impurity Conduction
- Piezoresistance and Magnetic Susceptibility in Heavily Doped n-Type Silicon
- Influence of Crystalline Defects and Residual Stress on the Electrical Characteristics of SOS MOS Devices
- Far-Infrared Photoconductivity in Phosphorus Doped n-Type Silicon in the Intermediate Impurity Concentration Region under Uniaxial Compressional Stress
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- Analysis of Telnperature Dependent Hall Conductivity in Silicon Inversion Layers in Strong Magnetic Fields by a Mobility Edge Model
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- Hall Effect in Silicon MOS Inversion Layers under Strong Magnetic Fields
- Energy Relaxation Process in n-Type InSb under Strong Longitudinal Magnetic Fields
- Electric Conduction in Phosphorus Doped Silicon at Low Temperatures
- Note on the Magnetoresistance in Dilute Magnetic Alloys
- Experiments on the Critical Exponent of Localization in Landau Subbands with the Landau Quantum Numbers 0 and 1 in Si-MOS Inversion Layers
- Experimental Correlation between Diagonal and Hall Conductivities of Silicon MOS inversion Layers in Strong Magnetic Fields
- Second Activation Energy in the Fractional Quantum Hall Effect
- Valley Splitting in Si(100)n-Channel Inversion Layers Determined by a Tilted Field Method
- Collapse of the Quantised Hall Resistance and Role of the Diagonal Resistivity in the Quantum Hall Effect(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)
- Experiments on Scaling Relation of Conductivities in Silicon MOS Inversion Layers in Strong Magnetic Fields
- Anderson Localization in Silicon MOS Inversion Layers at Low Densities
- Anisotropy of the Superconducting Energy Gap of Gallium Single Crystal Obtained from Tunneling Experiments
- The Temperature Dependence of the Superconducting Energy Gap of Gallium Single Crystal Obtained from Tunneling Measurements
- On the Anomalous Magnetoresistance Erect in n-InSb
- Hall Coefficient and Resistivity in the Intermediate Impurity Conduction of n-Type Germanium
- Negative Magnetoresistance and Inelastic Scattering Time in Si-MOS Inversion Layers
- Anomalous Magnetoresistance of Clean Cleaved Surfaces in InAs
- Spin-Orbit Interaction in Two Dimensiomal Systems in InAs n-Inversion Layers
- Magnetoresistance in the Impurity Conduction of n-type Germanium
- Experimental researches on quantum transport in semiconductor two-dimensional electron systems
- Surfons and the Electron Mobility in Silicon Inversion Layers
- Anomalous Magnetoresistance in the Field Parallel to the Interface in Si-MOS Inversion Layers
- Angular Distribution Measurements of Photoemitted Electrons for InAs by Means of Magnetic Field
- Experiments on Localization in Semiconductor Two-Dimensional Systems
- Negative Magnetoresistance in Silicon (100) MOS Inversion Layers
- Absorption of Sub-mm Radiation in Antimony Doped Germanium in the Matallic Type Impurity Conduction Region
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- Far Infrared Photoconductiviy in Antimony Doped Germanium in the Intermediate Impurity Concentration Region
- Negative Longitudinal Magnetoresistance in n-Type Indium Antimonide at 77K
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- The Two-Dimensional Lattice Scattering Mobility in a Semiconductor Inversion Layer
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