Determination of Atomic Scattering Factors of B.C.C. Metals by the Critical-Voltage Method
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概要
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The critical-voltage effect in electron diffraction has been applied to the 400 reflexion of b.c.c. metals, V, Cr, Fe and Nb, and the X-ray atomic scattering factors f^x for the first-order reflexion 200 have been determined from the measured values of critical voltages E_c by many-beam calculations. The results are compared with X-ray experimental data and theoretical scattering factors for free and solid atoms, and it is shown that the theoretical values for solid atoms calculated, e.g. by Wakoh and Yamashita agree well wiht the present results for V, Cr and Fe. It is pointed out that the reproducibility of the experimental data given by the present method is superior to that of the X-ray intensity measurements, and that the accurate measurement of scattering factors such as the present study serves as a sensitive and useful test of the band calculation.
- 社団法人日本物理学会の論文
- 1975-11-15
著者
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Uchida Yuji
Jeol Ltd.:(present Address) Max-planck-institut Fur Metallforschung
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WATANABE Denjiro
Department of Physics, Faculty of Science, Tohoku University
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TERASAKI Osamu
Department of Physics, Faculty of Science, Tohoku University
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Terasaki Osamu
Department Of Physics Faculty Of Science Tohoku University
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Watanabe Denjiro
Department Of Physics Tohoku University
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Watanabe Denjiro
Department Of Physics Faculty Of Science Tohoku Unviersity
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Watanabe Denjiro
Department Of Physics Faculty Of Science Tohoku University
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