Dimensionality Crossover of the Nonlinear Resistance in Quench-Condensed Indium Films
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概要
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Thickness dependence of the nonlinear resistance (FV characteristics) has been measured in quench-condensed films of indium with thicknesses of 14 nm, 26 nm and 65 nm. The I-V curves for the 14 nm-thick film are qualitatively similar to the previous result for the much thinner film (5 nm) whose superconducting properties were well described by the two-dimensional (2D) Kosterlitz-Thouless (KT) theory. In contrast, those for the thicker films are markedly different. As I is raised from zero at low temperatures, there appears the nonlinear I-V curve (resistance) which exhibits negative curvature.
- 社団法人日本物理学会の論文
- 1995-09-15
著者
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Okuma Satoshi
Research Center For Very Low Temperature System Tokyo Institute Of Technology
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Enya Keigo
Research Center For Very Low Temperature System Tokyo Institute Of Technology
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Hirai H
Research Center For Very Low Temperature System Tokyo Institute Of Technology
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Hirai Hideaki
Research Center for Very Low Temperature System, Tokyo Institute of Technology
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Hirai Hideaki
Research Center For Very Low Temperature System Tokyo Institute Of Technology
関連論文
- Dimensionality Crossover of the Nonlinear Resistance in Quench-Condensed Indium Films
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