3AB06 4層構造光導波路によりLB膜光学異方性及び膜厚の測定

概要

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For measuring the optical anisotropy of the PI-LB film, a Four Layers Optical Waveguide (FLOW) method was used. On the glass substrate, a waveguide and the PI-LB film with 31 monolayers are stacked. From the integrated optics theory, the eigen value equation of those guide modes was calculated. By analyzing the propagation of the guide modes, the anisotropic refractive index and the thickness of the PI-LB film are estimated. The results show that the anisotropic refractive index of the PI-LB film to be n_e=1.636407 and n_o=1.578014 and the film thickness of 9.8nm. Considering the average transfer ratio of an LB layer to be 70%, we can calculate the monolayer thickness of 0.45nm. These values are consistent with the results obtained by optical retardation measurements.
日本液晶学会の論文
1997-09-24