C/TbFeCo/Cr系薄膜の光磁気特性に与える各層の膜厚依存性の研究

概要

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This investigation is the effect of each layer on the magneto-optical properties in C/ThFeCo/Cr films. We made the Magneto-Optical (MO) disk for recording by the VCSEL array head. This MO disk consisted of the following materials: the protective layer was Carbon, the memory layer was TbFeCo and the under layer was Cr. The multi layer was produced by magnetron sputtering. The reflectance of TbFeCo was measured by a direct reading spectrometer. The reflectance of the films is over 60% at 960 nm as a wavelength of VCSEL laser irradiation. The dependence of the magneto-optical properties for the films on the thickness of TbFeCo memory layer was measured by Kerrloop. Kerr rotation angle is 0.31° and the squareness is 0.99 when the thickness of TbFeCo layer is 50 nm. Additionally, the dependence of the magneto-optical properties for the films on the thickness of the under layer was measured. The squareness reaches about 1.0 when the thickness of Cr layer is 10nm and it will not increase any more even if the thickness increase. However Kerr rotation angles doesn't depend on the under layer thickness. As a result, the optimum thickness of the each layers is the memory layer of TbFeCo is 50 nm and the under layer of Cr is 10 nm. The structure of these multi layers is promising for the MO media for recording by the VCSEL array head.
東海大学の論文
2000-03-10