Synthesis of New Amorphous Semiconductors Assembled from Transition-Metal-Encapsulating Si Clusters
スポンサーリンク
概要
- 論文の詳細を見る
We synthesized amorphous films composed of transition-metal-encapsulating Si clusters ($M$Sin: $M=\text{Mo}$ or Nb) by deposition of hydrogenated $M$SinHx clusters onto silica substrates followed by annealing at 500 °C for dehydrogenation. The MoSin ($n=7{\mbox{--}}16$) cluster films are semiconductors with an optical gap ${>}0.6$ eV and resistivity ${>}1$ $\Omega$ cm. In particular, the MoSi12 cluster film has a large gap of 1.1 eV and resistivity of 120 $\Omega$ cm with high hole mobility of 32 cm2/(V s). In these films, Si atoms form amorphous networks similar to those in hydrogenated amorphous Si but the electronic disorder is reduced by the use of $M$Sin clusters as the building blocks.
- Japan Society of Applied Physicsの論文
- 2008-12-25
著者
-
Tada Tetsuya
Nanodevice Innovation Research Center National Institute Of Advanced Industrial Science And Technolo
-
Uchida Noriyuki
Nanodevice Innovation Research Center National Institute Of Advanced Industrial Science And Technolo
-
Kanayama Toshihiko
Nanodevice Innovation Research Center National Institute Of Advanced Industrial Science And Technolo
-
Kintou Hiroshi
Nanodevice Innovation Research Center, National Institute of Advanced Industrial Science and Technol
-
Matsushita Yusuke
Nanodevice Innovation Research Center, National Institute of Advanced Industrial Science and Technol
-
Kintou Hiroshi
Nanodevice Innovation Research Center National Institute Of Advanced Industrial Science And Technolo
-
Matsushita Yusuke
Nanodevice Innovation Research Center National Institute Of Advanced Industrial Science And Technolo
関連論文
- Measurements of Electrostatic Potential Across p--n Junctions on Oxidized Si Surfaces by Scanning Multimode Tunneling Spectroscopy
- Synthesis of New Amorphous Semiconductors Assembled from Transition-Metal-Encapsulating Si Clusters
- Two Dimensional Dopant Profiling by Scanning Tunneling Microscopy
- Isotope Effect of Penetration of Hydrogen and Deuterium into Silicon through Si/SiO2 Interface
- Electronic States of P Donors in Si Nanocrystals Embedded in Amorphous SiO2 Layer Studied by Electron Spin Resonance: Hydrogen Passivation Effects