Built-in Electric Field Strength in InP/n^+-InP Determined by Photoellipsometry and Photoreflectance
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概要
- 論文の詳細を見る
- 1996-08-26
著者
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SHIRAKI Yasuhiro
Research Center for Advanced Science and Technology (RCAST), The University of Tokyo
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SAITOH Tadashi
Division of Electronic and Information Engineering, Faculty of Technology, Tokyo University of Agric
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Yaguchi Hiroyuki
Research Center For Advanced Science And Technology University Of Tokyo
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Xiong Yi-ming
Division Of Electronic And Information Engineering Tokyo University Of Agriculture And Technology
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Shiraki Yasuhiro
Research Center For Advanced Science And Technology (rcast) The University Of Tokyo
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Shiraki Yasuhiro
Research Center For Advanced Science And Technology University Of Tokyo
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Saitoh Tadashi
Division Of Electronic And Information Engineering Faculty Of Technology Tokyo University Of Agricul
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