HWE法により成長させたBi_2Te_3単結晶薄膜の結晶評価と熱電特性
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概要
- 論文の詳細を見る
- 1999-10-15
著者
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FUJIYASU Hiroshi
Faculty of Engineering, Shizuoka University
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Fujiyasu Hiroshi
Faculty Of Engineering Shizuoka University
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ISHIDA Akihiro
Faculty of Engineering, Shizuoka University
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Ishida Akihiro
Faculty Of Engineering Shizuoka University
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IZAWA Kazuyuki
Dev. Dept. 1, Suzuki Motor Corp.
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Izawa Kazuyuki
Dev. Dept. 1 Suzuki Motor Corp.
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- High Quality InGaN/GaN Single Heterostructures Grown by HWE With Mixed Source(Ga+In)Method
- Scanning Tunneling Mieroscopy and Barrier-Height Observation of Stearic Acid Thin Films Prepared by Blot-Wall Technique
- HWE法により成長させたBi_2Te_3単結晶薄膜の結晶評価と熱電特性
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