Direct atomic observation of Ge/(001)Si interfaces by image processing methods in high-resolution electron microscopy
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1998-12-01
著者
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TANAKA N.
Department of Health And Physical Education, Kyoto Sangyou University
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Hu J.
Department Of Applied Physics School Of Engineering Nagoya University
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Hu J.J.
Department of Applied Physics, School of Engineering, Nagoya University
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