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The authors are with the Lab. 328, Department of Electrical Engineering and Graduate Institute of El | 論文著者
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TANG Chih-Chun
The authors are with the Lab. 328, Department of Electrical Engineering and Graduate Institute of El
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WU Chia-Hsin
The authors are with the Lab. 328, Department of Electrical Engineering and Graduate Institute of El
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LIU Shen-Iuan
The authors are with the Lab. 328, Department of Electrical Engineering and Graduate Institute of El