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State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China | 論文著者
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Tao Bowan
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China
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Pan Gao
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China
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ZHANG Long-Long
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China
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CHEN Hong-Wei
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China
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CHEN Xiao-Lang
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China
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YANG Chuan-Ren
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China
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He Jiangping
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China
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Feng Xiaohui
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China
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Zhao Baolin
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China
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Wang Dongjun
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China
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Li Ping
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China
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LI Zehong
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China
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ZHANG Xiao
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of china