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State Key Lab of ASIC and Systems, Department of Microelectronics, Fudan University, Shanghai 200433, China | 論文著者
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Lu Hai-Sheng
State Key Lab of ASIC and Systems, Department of Microelectronics, Fudan University, Shanghai 200433, China
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Qu Xin-Ping
State Key Lab of ASIC and Systems, Department of Microelectronics, Fudan University, Shanghai 200433, China
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Zhang David
State Key Lab of ASIC and Systems, Department of Microelectronics, Fudan University, Shanghai 200433, China
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Ru Guo-Ping
State Key Lab of ASIC and Systems, Department of Microelectronics, Fudan University, Shanghai 200433, China
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Jiang Yu-Long
State Key Lab of ASIC and Systems, Department of Microelectronics, Fudan University, Shanghai 200433, China
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Ding Shao-Feng
State Key Lab of ASIC and Systems, Department of Microelectronics, Fudan University, Shanghai 200433, China
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Chen Fei
State Key Lab of ASIC and Systems, Department of Microelectronics, Fudan University, Shanghai 200433, China