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School of Materials Science and Engineering, and Inter-university Semiconductor Research Center (ISRC), Seoul National University, Seoul 151-742, Korea | 論文著者
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Lim Seung-Hyun
School of Materials Science and Engineering, and Inter-university Semiconductor Research Center (ISRC), Seoul National University, Seoul 151-742, Korea
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Park Tai-su
School of Materials Science and Engineering, and Inter-university Semiconductor Research Center (ISRC), Seoul National University, Seoul 151-742, Korea
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Lee Gun-Do
School of Materials Science and Engineering, and Inter-university Semiconductor Research Center (ISRC), Seoul National University, Seoul 151-742, Korea
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Song Sukchan
School of Materials Science and Engineering, and Inter-university Semiconductor Research Center (ISRC), Seoul National University, Seoul 151-742, Korea
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Yoon Euijoon
School of Materials Science and Engineering, and Inter-university Semiconductor Research Center (ISRC), Seoul National University, Seoul 151-742, Korea
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Lee Seung-Yoon
School of Materials Science and Engineering, and Inter-university Semiconductor Research Center (ISRC), Seoul National University, Seoul 151-742, Korea