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School of Electronic Engineering, Soongsil University, 511 Sangdo-dong, Dongjak-gu, Seoul 156-743, Korea | 論文著者
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Wee Jae-Kyung
School of Electronic Engineering, Soongsil University, 511 Sangdo-dong, Dongjak-gu, Seoul 156-743, Korea
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Kim Jinyoung
School of Electronic Engineering, Soongsil University, 511 Sangdo-dong, Dongjak-gu, Seoul 156-743, Korea
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Kim Chonghoon
School of Electronic Engineering, Soongsil University, 511 Sangdo-dong, Dongjak-gu, Seoul 156-743, Korea
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Shim Heesung
School of Electronic Engineering, Soongsil University, 511 Sangdo-dong, Dongjak-gu, Seoul 156-743, Korea
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Im Sungbin
School of Electronic Engineering, Soongsil University, 511 Sangdo-dong, Dongjak-gu, Seoul 156-743, Korea
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Lee Jaejin
School of Electronic Engineering, Soongsil University, 511 Sangdo-dong, Dongjak-gu, Seoul 156-743, Korea
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Seo Manjung
School of Electronic Engineering, Soongsil University, 511 Sangdo-dong, Dongjak-gu, Seoul 156-743, Korea