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School of Electrical Engineering, Seoul National University, Kwanak-Gu Shinlim-Dong, Seoul 151-744, Korea | 論文著者
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Liu Xueming
School of Electrical Engineering, Seoul National University, Kwanak-Gu Shinlim-Dong, Seoul 151-744, Korea
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Lee Byoungho
School of Electrical Engineering, Seoul National University, Kwanak-Gu Shinlim-Dong, Seoul 151-744, Korea
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Kim Hwi
School of Electrical Engineering, Seoul National University, Kwanak-Gu Shinlim-Dong, Seoul 151-744, Korea
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Choi Kyongsik
School of Electrical Engineering, Seoul National University, Kwanak-Gu Shinlim-Dong, Seoul 151-744, Korea
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Park Jae-Hyeung
School of Electrical Engineering, Seoul National University, Kwanak-Gu Shinlim-Dong, Seoul 151-744, Korea
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Kim Yunhee
School of Electrical Engineering, Seoul National University, Kwanak-Gu Shinlim-Dong, Seoul 151-744, Korea
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Bae Jang-Pyo
School of Electrical Engineering, Seoul National University, Kwanak-Gu Shinlim-Dong, Seoul 151-744, Korea