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School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea | 論文著者
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Yee Seong-Min
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Choi Jae-Wan
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Hong Su
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Kang Myung
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Lim Ju
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Jae-Hyun Ahn
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Kang Myung-Gil
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Ahn Jae-Hyun
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Dong-Hoon Hwang
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Hee-Tae Kim
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Jae-Seong Rieh
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Sung-Woo Hwang
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Myung-Gil Kang
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Lee Dong
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Hwang Sung
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Kim Gyu-Tae
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Ji Hyun-Jin
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea